Publications

100 / 3,815 publications found.


  •  Dong, Y., Yagyu, E., Matsuda, T., Teo, K.H., Lin, C., Rakheja, S., "An accurate electrical and thermal co-simulation framework for modeling high-temperature DC and pulsed I-V characteristics of GaN HEMTs", IEEE Journal of the Electron Devices Society, March 2025.
    BibTeX TR2025-041 PDF
    • @article{Dong2025mar,
    • author = {Dong, Yicong and Yagyu, Eiji and Matsuda, Takashi and Teo, Koon Hoo and Lin, Chungwei and Rakheja, Shaloo},
    • title = {{An accurate electrical and thermal co-simulation framework for modeling high-temperature DC and pulsed I-V characteristics of GaN HEMTs}},
    • journal = {IEEE Journal of the Electron Devices Society},
    • year = 2025,
    • month = mar,
    • url = {https://www.merl.com/publications/TR2025-041}
    • }
  •  Das, A., Rahman, S., Xiang, X., Palash, R.H., Hossain, T., Sikder, B., Yagyu, E., Nakamura, M., Teo, K.H., Chowdhury, N., "Inverse Design of AlGaN/GaN HEMT RF Device with Source Connected Field Plate", Advanced Theory and Simulations, March 2025.
    BibTeX TR2025-040 PDF
    • @article{Das2025mar,
    • author = {Das, Aurick and Rahman, Saimur and Xiang, Xiaofeng and Palash, Raffd Hassan and Hossain, Toiyob and Sikder, Bejoy and Yagyu, Eiji and Nakamura, Marika and Teo, Koon Hoo and Chowdhury, Nadim},
    • title = {{Inverse Design of AlGaN/GaN HEMT RF Device with Source Connected Field Plate}},
    • journal = {Advanced Theory and Simulations},
    • year = 2025,
    • month = mar,
    • url = {https://www.merl.com/publications/TR2025-040}
    • }
  •  Sikder, B., Hossain, T., Xie, Q., Niroula, J., Rajput, N.S., Teo, K.H., Amano, H., Palacios, T., Chowdhury, N., "Hole transport mechanism at high temperatures in p-GaN/AlGaN/GaN Heterostructure", Applied Physics Letters, DOI: 10.1063/​5.0203344, January 2025.
    BibTeX TR2025-014 PDF
    • @article{Sikder2025jan,
    • author = {Sikder, Bejoy and Hossain, Toiyob and Xie, Qingyun and Niroula, john and Rajput, Nitul S. and Teo, Koon Hoo and Amano, Hiroshi and Palacios, Tomas and Chowdhury, Nadim},
    • title = {{Hole transport mechanism at high temperatures in p-GaN/AlGaN/GaN Heterostructure}},
    • journal = {Applied Physics Letters},
    • year = 2025,
    • month = jan,
    • doi = {10.1063/5.0203344},
    • url = {https://www.merl.com/publications/TR2025-014}
    • }
  •  Hossain, T., Hossain, T., Anindya Alam, A., sikder, B., Xie, Q., Yuan, M., Yagyu, E., Teo, K.H., Palacios, T., Chowdhury, N., Wang, Y., "System-Technology Co-Optimization of Multimetal Gated AlGaN/GaN HEMT for Improved RF Linearity", Journal of Electron Devices Society, DOI: 10.1109/​JEDS.2024.3506618, December 2024.
    BibTeX TR2024-171 PDF
    • @article{Hossain2024dec,
    • author = {Hossain, Toiyob and Hossain, Tanvir and Anindya Alam, A. and sikder, Bejoy and Xie, Qingyun and Yuan, Mengyang and Yagyu, Eiji and Teo, Koon Hoo and Palacios, Tomas and Chowdhury, Nadim and Wang, Yebin},
    • title = {{System-Technology Co-Optimization of Multimetal Gated AlGaN/GaN HEMT for Improved RF Linearity}},
    • journal = {Journal of Electron Devices Society},
    • year = 2024,
    • month = dec,
    • doi = {10.1109/JEDS.2024.3506618},
    • url = {https://www.merl.com/publications/TR2024-171}
    • }
  •  Xiang, X., Palash, R., Yagyu, E., Dunham, S., Teo, K.H., Chowdhury, N., "AI-assisted Field Plate Design of GaN HEMT Device", Advanced Theory and Simulation, DOI: 10.1002/​adts.202400347, October 2024.
    BibTeX TR2024-152 PDF
    • @article{Xiang2024oct,
    • author = {Xiang, Xiaofeng and Palash, Rafid and Yagyu, Eiji and Dunham, Scott and Teo, Koon Hoo and Chowdhury, Nadim},
    • title = {{AI-assisted Field Plate Design of GaN HEMT Device}},
    • journal = {Advanced Theory and Simulation},
    • year = 2024,
    • month = oct,
    • doi = {10.1002/adts.202400347},
    • url = {https://www.merl.com/publications/TR2024-152}
    • }
  •  Hossain, T., sikder, B., Azad, M.T., Xie, Q., Yuan, M., Yagyu, E., Teo, K.H., Palacios, T., Chowdhury, N., "Fermi-Level Pinning Effect in Gate Region: A Case Study of Multi-Metal Gated AlGaN/GaN HEMT for High RF Linearity", IEEE Electron Devices Technology & Manufacturing Conference, DOI: 10.1109/​EDTM58488.2024.10512349, February 2024.
    BibTeX TR2024-010 PDF
    • @inproceedings{Hossain2024feb,
    • author = {Hossain, Toiyob and sikder, Bejoy and Azad, Md.Tasnim and Xie, Qingyun and Yuan, Mengyang and Yagyu, Eiji and Teo, Koon Hoo and Palacios, Tomas and Chowdhury, Nadim},
    • title = {{Fermi-Level Pinning Effect in Gate Region: A Case Study of Multi-Metal Gated AlGaN/GaN HEMT for High RF Linearity}},
    • booktitle = {IEEE Electron Devices Technology \& Manufacturing Conference},
    • year = 2024,
    • month = feb,
    • doi = {10.1109/EDTM58488.2024.10512349},
    • url = {https://www.merl.com/publications/TR2024-010}
    • }
  •  Azad, T., Hossain, T., Sikder, B., Xie, Q., Yuan, M., Yagyu, E., Teo, K.H., Palacios, T., Chowdhury, N., "AlGaN/GaN based Multi-Metal Gated High Electron Mobility Transistor with Improved Linearity", IEEE Transactions on Electron Devices, DOI: 10.1109/​TED.2023.3311422, Vol. 70, No. 1, pp. 5570-5576, December 2023.
    BibTeX TR2023-153 PDF
    • @article{Azad2023dec,
    • author = {Azad, Tasnim and Hossain, Toiyob and Sikder, Bejoy and Xie, Qingyun and Yuan, Mengyang and Yagyu, Eiji and Teo, Koon Hoo and Palacios, Tomas and Chowdhury, Nadim},
    • title = {{AlGaN/GaN based Multi-Metal Gated High Electron Mobility Transistor with Improved Linearity}},
    • journal = {IEEE Transactions on Electron Devices},
    • year = 2023,
    • volume = 70,
    • number = 1,
    • pages = {5570--5576},
    • month = dec,
    • doi = {10.1109/TED.2023.3311422},
    • url = {https://www.merl.com/publications/TR2023-153}
    • }
  •  Teo, K.H., "Summary Report of International Electron Device Meeting (IEDM) 2022," Tech. Rep. TR2023-013, Mitsubishi Electric Research Laboratories, March 2023.
    BibTeX TR2023-013 PDF
    • @techreport{Teo2023mar,
    • author = {Teo, Koon Hoo},
    • title = {{Summary Report of International Electron Device Meeting (IEDM) 2022}},
    • institution = {MERL website},
    • year = 2023,
    • month = mar,
    • url = {https://www.merl.com/publications/TR2023-013}
    • }
  •  Li, K., Matsuda, T., Nishimura, K., Yagyu, E., Teo, K.H., Rakheja, S., "Trapping Phenomena in GaN HEMTs with Fe- and C-doped Buffer", Device Research Conference, DOI: 10.1109/​DRC55272.2022.9855817, June 2022.
    BibTeX TR2022-086 PDF
    • @inproceedings{Li2022jun2,
    • author = {Li, Kexin and Matsuda, Takashi and Nishimura, Kunihiko and Yagyu, Eiji and Teo, Koon Hoo and Rakheja, Shaloo},
    • title = {{Trapping Phenomena in GaN HEMTs with Fe- and C-doped Buffer}},
    • booktitle = {Device Research Conference},
    • year = 2022,
    • month = jun,
    • doi = {10.1109/DRC55272.2022.9855817},
    • url = {https://www.merl.com/publications/TR2022-086}
    • }
  •  Teo, K.H., "Summary of IEDM Conference," Tech. Rep. TR2022-051, Mitsubishi Electric Research Laboratories, May 2022.
    BibTeX TR2022-051 PDF
    • @techreport{Teo2022may,
    • author = {Teo, Koon Hoo},
    • title = {{Summary of IEDM Conference}},
    • institution = {Mitsubishi Electric Research Laboratories},
    • year = 2022,
    • month = may,
    • doi = {10.1109/IEDM.1997.649430},
    • url = {https://www.merl.com/publications/TR2022-051}
    • }
  •  Teo, K.H., Zhang, Y., Chowdhury, N., Rakheja, S., Ma, R., Xie, Q., Yagyu, E., Yamanaka, K., Li, K., Palacios, T., "Emerging GaN technologies for power, RF, digital and quantum computing applications: recent advances and prospects", Journal of Applied Physics, DOI: 10.1063/​5.0061555, December 2021.
    BibTeX TR2022-002 PDF
    • @article{Teo2021dec,
    • author = {Teo, Koon Hoo and Zhang, Yuhao and Chowdhury, Nadim and Rakheja, Shaloo and Ma, Rui and Xie, Qingyun and Yagyu, Eiji and Yamanaka, Koji and Li, Kexin and Palacios, Tomas},
    • title = {{Emerging GaN technologies for power, RF, digital and quantum computing applications: recent advances and prospects}},
    • journal = {Journal of Applied Physics},
    • year = 2021,
    • month = dec,
    • doi = {10.1063/5.0061555},
    • url = {https://www.merl.com/publications/TR2022-002}
    • }
  •  Li, K., Yagyu, E., Sato, H., Teo, K.H., Rakheja, S., "Compact modeling of gate leakage phenomenon in GaN HEMTs", IEEE Transactions on Electron Devices, DOI: 10.23919/​SISPAD49475.2020.9241666, June 2021.
    BibTeX TR2021-079 PDF
    • @article{Li2021jun,
    • author = {Li, Kexin and Yagyu, Eiji and Sato, Hisashi and Teo, Koon Hoo and Rakheja, Shaloo},
    • title = {{Compact modeling of gate leakage phenomenon in GaN HEMTs}},
    • journal = {IEEE Transactions on Electron Devices},
    • year = 2021,
    • month = jun,
    • doi = {10.23919/SISPAD49475.2020.9241666},
    • url = {https://www.merl.com/publications/TR2021-079}
    • }
  •  Teo, K.H., "International Conference on Electron Device Meeting Report," Tech. Rep. TR2021-017, Mitsubishi Electric Research Laboratories, March 2021.
    BibTeX TR2021-017 PDF
    • @techreport{Teo2021mar,
    • author = {Teo, Koon Hoo},
    • title = {{International Conference on Electron Device Meeting Report}},
    • institution = {Mitsubishi Electric Research Laboratories},
    • year = 2021,
    • month = mar,
    • url = {https://www.merl.com/publications/TR2021-017}
    • }
  •  Teo, K.H., Chowdhury, N., Zhang, Y., Palacios, T., Yamanaka, K., Yamaguchi, Y., "Recent Development in 2D and 3D GaN devices for RF and Power Electronics Applications", IEEE International Symposium on Radio-Frequency Integration Technology (RFIT), DOI: 10.1109/​RFIT49453.2020.9226187, November 2020.
    BibTeX TR2020-162 PDF
    • @inproceedings{Teo2020nov,
    • author = {Teo, Koon Hoo and Chowdhury, Nadim and Zhang, Yuhao and Palacios, Tomas and Yamanaka, Koji and Yamaguchi, Yutaro},
    • title = {{Recent Development in 2D and 3D GaN devices for RF and Power Electronics Applications}},
    • booktitle = {IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)},
    • year = 2020,
    • month = nov,
    • doi = {10.1109/RFIT49453.2020.9226187},
    • url = {https://www.merl.com/publications/TR2020-162}
    • }
  •  Teo, K.H., "Ferroelectric memory field-effect transistors using CVD monolayer MoS2 as resistive switching channel", Applied Physics Letters, DOI: 10.1063/​1.5129963, Vol. 116, January 2020.
    BibTeX TR2020-012 PDF
    • @article{Teo2020jan,
    • author = {Teo, Koon Hoo},
    • title = {{Ferroelectric memory field-effect transistors using CVD monolayer MoS2 as resistive switching channel}},
    • journal = {Applied Physics Letters},
    • year = 2020,
    • volume = 116,
    • month = jan,
    • doi = {10.1063/1.5129963},
    • url = {https://www.merl.com/publications/TR2020-012}
    • }
  •  Li, K., Teo, K.H., "Gate Leakage Mechanisms and Modeling in GaN based High Electron Mobility Transistors – Literature Survey," Tech. Rep. TR2019-160, Mitsubishi Electric Research Laboratories, December 2019.
    BibTeX TR2019-160 PDF
    • @techreport{Li2019sep,
    • author = {Li, Kexin and Teo, Koon Hoo},
    • title = {{Gate Leakage Mechanisms and Modeling in GaN based High Electron Mobility Transistors – Literature Survey}},
    • institution = {Mitsubishi Electric Research Laboratories},
    • year = 2019,
    • month = dec,
    • url = {https://www.merl.com/publications/TR2019-160}
    • }
  •  Teo, K.H., "Report on ISPSD 2019," Tech. Rep. TR2019-161, Mitsubishi Electric Research Laboratories, December 2019.
    BibTeX TR2019-161 PDF
    • @techreport{Teo2019dec,
    • author = {Teo, Koo Hoo},
    • title = {{Report on ISPSD 2019}},
    • institution = {Mitsubishi Electric Research Laboratories},
    • year = 2019,
    • month = dec,
    • url = {https://www.merl.com/publications/TR2019-161}
    • }
  •  Sangwan, A., Ma, R., Wang, B., Kim, K.J., Parsons, K., Koike-Akino, T., Wang, P., Orlik, P.V., Teo, K.H., Tasuku, K., Kazunari, K., Fukasawa, T., "CDM-based 4-Channel Digital Beamforming Transmitter Using a Single DAC", IEEE International New Circuits and Systems Conference, DOI: 10.1109/​NEWCAS44328.2019.8961250, June 2019, pp. 1-4.
    BibTeX TR2019-058 PDF
    • @inproceedings{Sangwan2019jun,
    • author = {Sangwan, Amit and Ma, Rui and Wang, Bingnan and Kim, Kyeong Jin and Parsons, Kieran and Koike-Akino, Toshiaki and Wang, Pu and Orlik, Philip V. and Teo, Koon Hoo and Tasuku, Kuriyama and Kazunari, Kihira and Fukasawa, Toru},
    • title = {{CDM-based 4-Channel Digital Beamforming Transmitter Using a Single DAC}},
    • booktitle = {IEEE International New Circuits and Systems Conference},
    • year = 2019,
    • pages = {1--4},
    • month = jun,
    • publisher = {IEEE},
    • doi = {10.1109/NEWCAS44328.2019.8961250},
    • isbn = {978-1-7281-1031-8},
    • url = {https://www.merl.com/publications/TR2019-058}
    • }
  •  Teo, K.H., "Trip Report on IEDM 2018," Tech. Rep. TR2018-193, Mitsubishi Electric Research Laboratories, March 2019.
    BibTeX TR2018-193 PDF
    • @techreport{Teo2019mar1,
    • author = {Teo, Koon Hoo},
    • title = {{Trip Report on IEDM 2018 }},
    • institution = {Mitsubishi Electric Research Laboratories},
    • year = 2019,
    • month = mar,
    • url = {https://www.merl.com/publications/TR2018-193}
    • }
  •  Teo, K.H., "Trip Report on International Symposium on the Physical and Failure Analysis of Integrated Circuits 2018 and NTU-MIT Alliance Labs Visit," Tech. Rep. TR2018-194, Mitsubishi Electric Research Laboratories, March 2019.
    BibTeX TR2018-194 PDF
    • @techreport{Teo2019mar2,
    • author = {Teo, Koon Hoo},
    • title = {{Trip Report on International Symposium on the Physical and Failure Analysis of Integrated Circuits 2018 and NTU-MIT Alliance Labs Visit}},
    • institution = {Mitsubishi Electric Research Laboratories},
    • year = 2019,
    • month = mar,
    • url = {https://www.merl.com/publications/TR2018-194}
    • }
  •  Wang, B., Lin, C., Teo, K.H., "Coupled-Mode Analysis for Near-Field Thermal Radiation Devices", Biennial IEEE Conference on Electromagnetic Field Computation (CEFC), October 2018.
    BibTeX TR2018-154 PDF
    • @inproceedings{Wang2018oct,
    • author = {Wang, Bingnan and Lin, Chungwei and Teo, Koon Hoo},
    • title = {{Coupled-Mode Analysis for Near-Field Thermal Radiation Devices}},
    • booktitle = {Biennial IEEE Conference on Electromagnetic Field Computation (CEFC)},
    • year = 2018,
    • month = oct,
    • url = {https://www.merl.com/publications/TR2018-154}
    • }
  •  Sadamoto, K., Tsujita, W., Sawa, Y., Wang, B., Ma, R., Wang, P., Teo, K.H., Orlik, P.V., Kato, K., Nakajima, M., "Terahertz Polarimetric Sensing for Linear Encoder", International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW THz), DOI: 10.1109/​IRMMW-THz.2018.8510391, September 2018.
    BibTeX TR2018-142 PDF
    • @inproceedings{Sadamoto2018sep,
    • author = {Sadamoto, Kota and Tsujita, Wataru and Sawa, Yoshitsugu and Wang, Bingnan and Ma, Rui and Wang, Pu and Teo, Koon Hoo and Orlik, Philip V. and Kato, K. and Nakajima, M.},
    • title = {{Terahertz Polarimetric Sensing for Linear Encoder}},
    • booktitle = {International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW THz)},
    • year = 2018,
    • month = sep,
    • doi = {10.1109/IRMMW-THz.2018.8510391},
    • url = {https://www.merl.com/publications/TR2018-142}
    • }
  •  Dinis, D., Ma, R., Shinjo, S., Yamanaka, K., Teo, K.H., Orlik, P.V., Oliveira, A., Vieira, J., "A Real-time Architecture for Agile and FPGA-based Concurrent Triple-Band All-Digital RF Transmission", IEEE Transaction on Microwave Theory and Techniques, DOI: 10.1109/​TMTT.2018.2860972, Vol. 66, No. 11, pp. 4955-4966, August 2018.
    BibTeX TR2018-105 PDF Video
    • @article{Dinis2018aug,
    • author = {Dinis, Daniel and Ma, Rui and Shinjo, Shintaro and Yamanaka, Koji and Teo, Koon Hoo and Orlik, Philip V. and Oliveira, Arnaldo and Vieira, Jose},
    • title = {{A Real-time Architecture for Agile and FPGA-based Concurrent Triple-Band All-Digital RF Transmission}},
    • journal = {IEEE Transaction on Microwave Theory and Techniques},
    • year = 2018,
    • volume = 66,
    • number = 11,
    • pages = {4955--4966},
    • month = aug,
    • doi = {10.1109/TMTT.2018.2860972},
    • url = {https://www.merl.com/publications/TR2018-105}
    • }
  •  Ma, R., Benosman, M., Manjunatha, K., Komatsuszaki, Y., Shinjo, S., Teo, K.H., Orlik, P.V., "Machine-Learning Based Digital Doherty Power Amplifier", IEEE International Symposium on Radio Frequency Integration Technology (RFIT), DOI: 10.1109/​RFIT.2018.8524126, August 2018.
    BibTeX TR2018-114 PDF Video
    • @inproceedings{Ma2018aug,
    • author = {Ma, Rui and Benosman, Mouhacine and Manjunatha, Koushik and Komatsuszaki, Yuji and Shinjo, Shintaro and Teo, Koon Hoo and Orlik, Philip V.},
    • title = {{Machine-Learning Based Digital Doherty Power Amplifier }},
    • booktitle = {IEEE International Symposium on Radio Frequency Integration Technology (RFIT)},
    • year = 2018,
    • month = aug,
    • doi = {10.1109/RFIT.2018.8524126},
    • url = {https://www.merl.com/publications/TR2018-114}
    • }
  •  Dinis, D., Ma, R., Teo, K.H., Orlik, P.V., Oliveira, A., Vieira, J., "An FPGA-based Multi-level All-Digital Transmitter with 1.25 GHz of Bandwidth", IEEE International Microwave Symposium (IMS), DOI: 10.1109/​MWSYM.2018.8439490, June 2018, pp. 659-662.
    BibTeX TR2018-075 PDF Video
    • @inproceedings{Dinis2018jun,
    • author = {Dinis, Daniel and Ma, Rui and Teo, Koon Hoo and Orlik, Philip V. and Oliveira, Arnaldo and Vieira, Jose},
    • title = {{An FPGA-based Multi-level All-Digital Transmitter with 1.25 GHz of Bandwidth}},
    • booktitle = {IEEE International Microwave Symposium (IMS)},
    • year = 2018,
    • pages = {659--662},
    • month = jun,
    • doi = {10.1109/MWSYM.2018.8439490},
    • url = {https://www.merl.com/publications/TR2018-075}
    • }