TR2005-046

Measuring Skin Reflectance and Subsurface Scattering

    •  Tim Weyrich, Wojciech Matusik, Hanspeter Pfister, Addy Ngan, Markus Gross, "Measuring Skin Reflectance and Subsurface Scattering", Tech. Rep. TR2005-046, Mitsubishi Electric Research Laboratories, Cambridge, MA, July 2005.
      BibTeX TR2005-046 PDF
      • @techreport{MERL_TR2005-046,
      • author = {Tim Weyrich, Wojciech Matusik, Hanspeter Pfister, Addy Ngan, Markus Gross},
      • title = {Measuring Skin Reflectance and Subsurface Scattering},
      • institution = {MERL - Mitsubishi Electric Research Laboratories},
      • address = {Cambridge, MA 02139},
      • number = {TR2005-046},
      • month = jul,
      • year = 2005,
      • url = {https://www.merl.com/publications/TR2005-046/}
      • }
  • Research Area:

    Computer Vision

Abstract:

it is well known that human facial skin has complex reflectance properties that are difficult to model, render, and edit. We built two measurement devices to analyze and reconstruct the reflectance properties of facial skin. One device is a dome-structured face scanning system equipped with 16 cameras and 150 point light sources that is used to acquire BRDF samples of a face. The other device is a touch-based HDR imaging system to measure subsurface scattering properties of the face. In this technical report we describe how these devices are constructed, calibrated, and used to acquire high-quality reflectance data of human faces.